- Wavelength- Dispersive X-ray Analysis
- Electronics: WDXA
Универсальный русско-английский словарь. Академик.ру. 2011.
Универсальный русско-английский словарь. Академик.ру. 2011.
Wavelength dispersive X-ray spectroscopy — The Wavelength dispersive X ray spectroscopy (WDXRF or WDS) is a method used to count the number of X rays of a specific wavelength diffracted by a crystal. The wavelength of the impinging x ray and the crystal s lattice spacings are related by… … Wikipedia
Energy-dispersive X-ray spectroscopy — (EDS, EDX or EDXRF) is an analytical technique used for the elemental analysis or chemical characterization of a sample. As a type of spectroscopy, it relies on the investigation of a sample through interactions between electromagnetic radiation… … Wikipedia
X-ray photoelectron spectrometry — Spectrométrie de fluorescence X Pour les articles homonymes, voir SFX, FX et XRF. Un spectromètre de fluorescence X Philips PW1606 avec manutention automatiq … Wikipédia en Français
X-ray — [ 22 December 1895 and presented to Professor Ludwig Zehnder of the Physik Institut, University of Freiburg, on 1 January 1896. The dark oval on the third finger is a shadow produced by her ring. [cite book last = Kevles first =Bettyann Holtzmann … Wikipedia
List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy … Wikipedia
Characteristic x-ray — A high energy electron interacts with a bound electron in an atom and ejects it. The incident electron is scattered and the target electron gets displaced from its shell. The incident electron energy must exceed the binding energy of the electron … Wikipedia
Ray tracing (physics) — In physics, ray tracing is a method for calculating the path of waves or particles through a system with regions of varying propagation velocity, absorption characteristics, and reflecting surfaces. Under these circumstances, wavefronts may bend … Wikipedia
X-ray fluorescence — (XRF) is the emission of characteristic secondary (or fluorescent) X rays from a material that has been excited by bombarding with high energy X rays or gamma rays. The phenomenon is widely used for elemental analysis and chemical analysis,… … Wikipedia
WDXA — Wavelength Dispersive X ray Analysis (Academic & Science » Electronics) … Abbreviations dictionary
Multi-wavelength anomalous dispersion — Multi wavelength anomalous diffraction (sometimes Multi wavelength anomalous dispersion; abbreviated MAD) is a technique used in X ray crystallography that facilitates the determination of the three dimensional structure of biological… … Wikipedia
Particle-Induced X-ray Emission — or Proton Induced X ray Emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the … Wikipedia